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Z scanner heads

Park Systems has developed a range of Z scanner heads that help to make Park AFMs the world’s most accurate. All of our heads feature:

SLD  for better cantilever deflection detection

Our heads use Super Luminescence Diode (SLD) to give the most accurate cantilever deflection detection available.

Independent Z-Scan range selection

Because our heads separate the XY scanner from the Z scanner, you have complete control over the Z scan range. 

 

Standard NX AFM Head

The standard NX AFM head is a high speed Z scanner with 15 µm scan range. It is our default head for all of the NX-series AFMs.

Standard-NX-AFM-Head

Specifications :

Z scan range: 15 µm
Resonant frequency of Z-scanner: > 9 kHz
Detection type: Super-Luminescence Diode (830 nm)
Noise floor: < 0.05 nm (typically 0.03 nm)
 

Long Travel NX AFM Head

The long travel NX AFM head gives extended Z scan range capability to the NX series of AFMs.
NX LongHead

Specifications :

Z scan range: 30 µm
Resonant frequency of Z-scanner: > 2.0 kHz
Detection type: Super-Luminescence Diode (830 nm)
Noise floor: < 0.05 nm (typically 0.03 nm)
 

 

SICM NX Head for NX10/NX12

The standard NX SICM head is a high force Z scanner with 15 µm scan range. It is optional head for NX10 and NX12 systems.

Specifications :

Z scan range: 15 µm
Includes a low-noise, high-precision current amplifier
Current noise in buffer: ≤ 650 fA
 

 

SICM Long Travel Head for NX10/NX12

The long travel NX SICM head provides extended Z scan range capability to NX10 and NX12 systems.

Specifications :

Z scan range: 30 µm
Includes a low-noise, high-precision current amplifier
Current noise in buffer: ≤ 650 fA
 

Standard XE Head

Our standard XE head is the ideal for most uses and works with all standard and the advanced modes for XE-series AFMs.

Standard-XE-Head

Specifications :

Z scan range: 12 µm
Resonant frequency of Z-scanner: > 5 kHz
Detection type: Super Luminescence Diode (830 nm) , standard
Noise floor: < 0.02 nm (typical), 0.05 nm (maximum)
 

 

Long Travel XE AFM Head

Give your XE series AFM an extended scanning range with the 25 µm Z-scanner. This head is perfect for high aspect ratio samples such as optical lenses and MEMS device. The head is fully compatible with all basic and advanced modes and options.

Specifications :

Z scan range: 25 µm
Resonant frequency: > 1.7 kHz
Detection type: Super Luminescence Diode (830 nm)
Noise floor: < 0.05 nm (typically 0.03 nm)
 

XE Optical Head

The XE Optical Head lets you use the cantilever of the AFM for light amplification when combined with Raman spectroscopy (Raman is no longer available), enhancing the optical response of the sample. The XE Optical Head provides wide optical accessibility from top, bottom, and side to deliver the best possible beam. This option is compatible with all the options of XE-series AFM.

XE-10nm-Optical-Head

Specifications :

Optical accessibility: top and side
Z scan range
: 12 µm or 25 µm
Resonant frequency: 3 kHz (12 µm XE Head), 1.7 kHz (25 µm XE Head)
Detection type:Super Luminescence Diode (830 nm)
Noise floor: 0.03 nm (typical), 0.05 nm (maximum)