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AFM Probe Selection Guide
How to choose an AFM probe
AFM Probe Selection Guide Book
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For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Adama Innovations, Applied Nano Structures, Inc, BudgetSensors, MikroMasch, Nanosensors™, Nanotools GmbH, Nanoworld AG, NuNano, Olympus Corp., are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The performance of probes ordered from other sources are not guaranteed.

Probe Force Constant (N/m) Frequency (kHz ) Manufacturer Short Description Quote
PPP-NCHR 42 330 Nanosensors ▪ Cantilever with high resonant frequency
▪ Backside reflex coating (AI)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		Request for Quote

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
SSS-NCHR 42 330 Nanosensors ▪ Non-contact cantilever with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: ~2 nm (<5 nm) 		Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
PPP-NCH 42 330 Nanosensors ▪ Non-contact cantilever with high resonant frequency
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
SSS-NCH 42 330 Nanosensors ▪ High-frequency cantilever with super sharp tip
▪ Typical tip radius: ~2 nm (<5 nm) 		Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
PPP-NCLR 48  190  Nanosensors ▪ Non-contact cantilever with low resonant frequency
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
SSS-NCLR 48 190 Nanosensors ▪ Low-frequency cantilever with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: ~2 nm (<5 nm) 		Request for Quote
 
Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
PPP-NCL 48  190  Nanosensors ▪ Non-contact cantilever with low resonant frequency
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		Request for Quote
 
Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
SSS-NCL  48  190  Nanosensors ▪ Low-frequency cantilever with super sharp tip
▪ Typical tip radius: ~2 nm (<5 nm) 		Request for Quote
 
Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 196
NSC15/AL BS  40  325  Mikromasch ▪ High-frequency cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm 		 Request for Quote

Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also good for non-contact AFM. 

Technical Data Nominal Value Specified Range
Thickness /µm 4 3.5 - 4.5
Mean Width /µm 30 27 - 33
Length /µm 125 120 - 130
Force Constant /(N/m) 40 20 - 80
Resonance Frequency /kHz 325 265 - 410
AR5-NCH  42  330  Nanosensors ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm) 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
AR5-NCLR  48  190  Nanosensors ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 7.0 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
AR5-NCHR  42  320  Nanosensors ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm
 		 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
AR5T-NCHR  42  330  Nanosensors ▪ Non-contact cantilever with high aspect ratio tip (>5:1)
▪ Backside reflex coating (Al)
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~2 μm
▪ Typical tip radius: <15 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
OMCL-AC160TS  26  300  Olympus ▪ Non-contact cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Tip shape: Sharpened tetrahedral on zero setback position
▪ Typical tip length: ~14 μm
▪ Typical tip radius: ~7 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 3.7  
Mean Width /µm 40  
Length /µm 160  
Force Constant /(N/m) 26  
Resonance Frequency /kHz 300 200 - 400
ATEC-NC  45  335  Nanosensors ▪ Non-contact cantilever
▪ Tip shape: Tetrahedral tip on zero setback position
▪ Typical tip length: 15 - 20 μm
▪ Typical tip radius: <10 nm 		 Request for Quote

These tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever allowing it to be the only probe to offer real tip visibility from the top even if the probe is tilted.

Technical Data Nominal Value Specified Range
Thickness /µm 4.6 3.6 - 5.6
Mean Width /µm 45 40 - 50
Length /µm 160 150 - 170
Force Constant /(N/m) 45 12 - 110
Resonance Frequency /kHz 335 210 - 490
ATEC-NC  45  335  Nanosensors ▪ Non-contact cantilever
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral tip on zero setback position
▪ Tip coated with Cr-Au
▪ Typical tip length: 15 - 20 μm
▪ Typical tip radius: <10 nm 		 Request for Quote
ACTA  37  300  AppNano ▪ Cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Typical tip length: 14 - 16 μm
▪ Typical tip radius: ~6 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.5 - 4.5
Mean Width /µm 30 25 - 35
Length /µm 125 115 - 135
Force Constant /(N/m) 37 13 - 77
Resonance Frequency /kHz 300 200 - 400
HARTA-12-2  40  300  AppNano ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12° ▪ Typical spike length: ~2 μm ▪ Typical tip radius: ~30 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.5 4.0 - 5.0
Mean Width /µm 35.0 30.0 - 40.0
Length /µm 125.0 115.0 - 135.0
Force Constant /(N/m) 40 25 - 75
Resonance Frequency /kHz 300 200 - 400
HARTA-12-4  40  300  AppNano ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12° ▪ Typical spike length: ~4 μm ▪ Typical tip radius: ~30 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.5 4.0 - 5.0
Mean Width /µm 35.0 30.0 - 40.0
Length /µm 125.0 115.0 - 135.0
Force Constant /(N/m) 40 25 - 75
Resonance Frequency /kHz 300 200 - 400
HARTA-12-6  40  300  AppNano ▪ Non-contact cantilever with high aspect ratio tip
▪ Backside reflective coating (Al)
▪ Tip shape: Pyramidal
▪ Tip tilt compensation: 12° ▪ Typical spike length: ~6 μm ▪ Typical tip radius: ~30 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.5 4.0 - 5.0
Mean Width /µm 35.0 30.0 - 40.0
Length /µm 125.0 115.0 - 135.0
Force Constant /(N/m) 40 25 - 75
Resonance Frequency /kHz 300 200 - 400
EBD2-100A  40  320  nanotools ▪ Non-contact cantilever with high aspect ratio tip (>6:1) (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~2 μm
▪ Typical tip radius: <5 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.4 3.9 - 4.9
Mean Width /µm 30.0 28.0 - 32.0
Length /µm 120.0 115.0 - 125.0
Force Constant /(N/m) 40 20 - 60
Resonance Frequency /kHz 320 270 - 370
EBD-24  40  320  nanotools ▪ Non-contact cantilever
▪ Backside reflex coating (Al)
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~24 μm 		 Request for Quote
EBD4-200A  40  320  nanotools ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~4 μm (max.)
▪ Typical tip radius: <5 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.4 3.9 - 4.9
Mean Width /µm 30.0 28.0 - 32.0
Length /µm 120.0 115.0 - 125.0
Force Constant /(N/m) 40 20 - 60
Resonance Frequency /kHz 320 270 - 370
EBD6-400A  40  320  nanotools ▪ Non-contact cantilever with high aspect ratio tip (>10:1) (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~6 μm (max.)
▪ Typical tip radius: <5 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.4 3.9 - 4.9
Mean Width /µm 30.0 28.0 - 32.0
Length /µm 120.0 115.0 - 125.0
Force Constant /(N/m) 40 20 - 60
Resonance Frequency /kHz 320 270 - 370
MCNT-100™ Park AAFM  40  320  nanotools ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~100 nm ▪ Typical tip radius: ~2 nm (<5 nm) 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.4 3.9 - 4.9
Mean Width /µm 30.0 28.0 - 32.0
Length /µm 120.0 115.0 - 125.0
Force Constant /(N/m) 40 20 - 60
Resonance Frequency /kHz 320 270 - 370
MCNT-150™ Park AAFM  40  320  nanotools ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~150 nm ▪ Typical tip radius: ~2 nm (<5 nm) 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.4 3.9 - 4.9
Mean Width /µm 30.0 28.0 - 32.0
Length /µm 120.0 115.0 - 125.0
Force Constant /(N/m) 40 20 - 60
Resonance Frequency /kHz 320 270 - 370
MCNT-300 Park AAFM  40  320  nanotools ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~300 nm ▪ Typical tip radius: ~5 nm (<7 nm) 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.4 3.9 - 4.9
Mean Width /µm 30.0 28.0 - 32.0
Length /µm 120.0 115.0 - 125.0
Force Constant /(N/m) 40 20 - 60
Resonance Frequency /kHz 320 270 - 370
MCNT-400  40  320  nanotools ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~400 nm ▪ Typical tip radius: ~5 nm (<7 nm) 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.4 3.9 - 4.9
Mean Width /µm 30.0 28.0 - 32.0
Length /µm 120.0 115.0 - 125.0
Force Constant /(N/m) 40 20 - 60
Resonance Frequency /kHz 320 270 - 370
MCNT-500  40  320  nanotools ▪ Non-contact cantilever with thin amorphous CNT tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: CNT
▪ Tip tilt compensation: 12°
▪ Typical spike length: ~500 nm ▪ Typical tip radius: ~5 nm (<7 nm) 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4.4 3.9 - 4.9
Mean Width /µm 30.0 28.0 - 32.0
Length /µm 120.0 115.0 - 125.0
Force Constant /(N/m) 40 20 - 60
Resonance Frequency /kHz 320 270 - 370
HI'RES-C14/Cr-Au  5  160  MikroMasch ▪ Non-contact cantilever with low resonant frequency
▪ Backside reflective coating (Au)
▪ Typical spike length: 100 - 200 nm
▪ Typical tip radius: ~1 nm 		 Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 2.1 1.6 - 2.6
Mean Width /µm 25.0 22.0 - 28.0
Length /µm 125.0 120.0 - 130.0
Force Constant /(N/m) 5 1.8 - 13
Resonance Frequency /kHz 160 110 - 160
Scout 70 2 70 ▪ Non-contact cantilever with low resonant frequency
▪ Backside reflex coating (Al)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~5 nm (<10 nm) 		Request for Quote
Scout 150 18 150 ▪ Non-contact cantilever
▪ Backside reflex coating (Al)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~5 nm (<10 nm) 		Request for Quote
Scout 350 42 350 ▪ Non-contact cantilever
▪ Backside reflex coating (Al)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~5 nm (<10 nm) 		Request for Quote
160AC-NG 26 300 Opus ▪ High-frequency cantilever suitable for tapping mode
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Typical tip length: ~14 μm
▪ Typical tip radius: <7 nm 		Request for Quote
240AC-NA 2 70 Opus ▪ Non-Contact cantilever with low resonant frequency
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: ~14 μm
▪ Typical tip radius: <7 nm 		Request for Quote
BL-AC40TS 0.09 110 (25 in water) Olympus ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~8 nm 		Request for Quote
Cantilever
Resonance Frequency [kHz] 110
(75 - 145)
25 in water
(17 - 45)
Spring Constant [N/m] 0.09
(0.02 - 0.14)
Shape Rectangular
Length × Width × Thickness [µm] 38×16×0.2
Probe
Shape Tetrahedral
Length [µm] 7
Effective probe length [µm] 3.5
Tip radius [nm] 8
EBD-16 40 320 Olympus ▪ Non-contact cantilever with high aspect ratio tip (HDC/DLC)
▪ Backside reflex coating
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical tip length: ~16 um 		Request for Quote
OMCL-AC240TS 2 70 Olympus ▪ Non-Contact cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: 7 nm 		Request Quote
Cantilever
Resonance Frequency [kHz] 70
(50 - 90)
Spring Constant [N/m] 2
(0.6 - 3.5)
Shape Rectangular
Length × Width × Thickness [µm] 240×40×2.3
PPP-XYNCSTR 7.4 160 Nanosensors ▪ Non-contact/Tapping Mode cantilever
▪ Backside reflex coating (Al)
▪ Tip shape: 4-sided
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~7 nm 		Request Quote
PPP-CONTSCR 0.2 25 Nanosensors ▪ Contact cantilever
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		Request for Quote

The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

Technical Data Nominal Value Specified Range
Thickness /µm 1 0.1-2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 23 1 - 57
NSC36/Al BS 1
2
0.6		 90
130
65		 Mikromasch ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm ▪ 3 cantilevers on a chip 		Request for Quote
.
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
PNP-DB 0.48
0.06		 67
17		 Nanoworld ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ Typical tip length: 3.5 μm
▪ 2 cantilevers on a chip 		Request for Quote
Cantilever Data Cant. 1 Cant. 2
Thickness 0.5 µm 0.5 µm
Mean Width 40 µm 40 µm
Length 100 µm 200 µm
Force Constant 0.48 N/m 0.06 N/m
Resonance Frequency 67 kHz 17 kHz
NSC36/HARD/AI BS 1
2
0.6		 90
130
65		 Mikromasch ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm ▪ 3 cantilevers on a chip 		Request for Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
PNP-DB 0.48
0.06		 67
17		 Nanoworld ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ Typical tip length: 3.5 μm
▪ 2 cantilevers on a chip 		Request for Quote
Cantilever Data Cant. 1 Cant. 2
Thickness 0.5 µm 0.5 µm
Mean Width 40 µm 40 µm
Length 100 µm 200 µm
Force Constant 0.48 N/m 0.06 N/m
Resonance Frequency 67 kHz 17 kHz
PNP-TR 0.32
0.08		 67
17		 Nanoworld ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ 2 triangular cantilevers on a chip 		Request for Quote
Cantilever Data Cant. 1 Cant. 2
Thickness 0.5 µm 0.5 µm
Mean Width 13.5 µm 28 µm
Length 100 µm 200 µm
Force Constant 0.32 N/m 0.08 N/m
Resonance Frequency 67 kHz 17 kHz
PPP-LFMR 0.2 23 Nanosensors ▪ Contact cantilever with high sensitivity for lateral/frictional force measurement
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		Request for Quote
Cantilever Data Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length / µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 23 1 - 57
200AC-NA 9 135 Opus ▪ Probe suitable for tapping
▪ Backside reflective coating (Al)
▪ Tetrahedral tip on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: <7 nm 		Request for Quote
3XC-NA 0.3
9
2.5		 17
150
75		 Opus ▪ Probe suitable for contact or tapping mode
▪ Backside reflex coating (Al)
▪ Typical tip length: ~14 μm
▪ Typical tip radius: <7 nm ▪ 3 cantilevers on a chip 		Request for Quote
CSC17/Cr-Au 0.18 13 mikromasch ▪ Probe suitable for contact, LFM and C-AFM
▪ Backside reflex coating (Cr-Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 15 μm
▪ Typical tip radius: <35 nm 		Request for Quote
CSC17/Pt 0.18 13 mikromasch ▪ Probe suitable for contact mode
▪ Backside reflex coating (Cr/Pt-Ir5)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm 		Request for Quote
PPP-CONTPt 0.5 13 Nanosensors ▪ Probe suitable for contact mode
▪ Backside reflex coating (Cr/Pt-Ir5)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm 		Request for Quote
SHOCONA 0.14 21 Appnano ▪ Contact cantilever
▪ Backside reflex coating (Al)
▪ Tip shape: Pyramidal
▪ Typical tip length: 14 - 16 μm
▪ Typical tip radius: <6 nm 		Request for Quote
CDT-FMR 80 400 Nanosensors ▪ Probe suitable for SSRM/lithography
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm 		Request for Quote
CDT-NCHR 80 400 Nanosensors ▪ Probe suitable for SSRM/lithography (tip bias mode (oxidation mode))
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 80 23 - 225
Resonance Frequency /kHz 400 225 - 610
AD-2.8-AS 2.8 65 ▪ Contact cantilever for conductive AFM (C-AFM)/SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm 		Request for Quote
AD-2.8-SS 2.8 65 ▪ Contact cantilever for conductive AFM (C-AFM)/SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~5 nm 		Request for Quote
PPP-EFM 2.8 75 Nanosensors ▪ Probe for PFM/Conductive AFM/DC-EFM/SCM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm 		Request Quote

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
25Pt300B 18 20 Rocky Mountain Nanotechnology ▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm 		Request Quote

The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 300 ± 15%
Cantilever width /µm 110 ± 15%
Spring constant /(N/m) 18 ± 40%
Frequency /kHz 20 ± 30%
Tip radius /nm < 20  
SPARK 70 Pt 2 70 ▪ Probe for EFM/KPFM/PFM/SCM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm 		Request for Quote
SPARK 150 Pt 18 150 ▪ PProbe for EFM/KPFM/PFM/SCM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm 		Request for Quote
SPARK 350 Pt 42 350 ▪ Probe for EFM/KPFM/PFM/SCM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm 		Request for Quote
CDT-CONTR 0.5 20 Nanosensors ▪ Contact cantilever for conductive AFM
▪ Probe suitable for lithography (tip bias mode (oxidation mode))
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm 		Request for Quote

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.5 0.1 - 1.7
Resonance Frequency /kHz 20 11 - 29
PPP-CONTSCPt 0.2 25 Nanosensors ▪ Probe for PFM/C-AFM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm 		Request for Quote

The NANOSENSORS™ PPP-CONTSCPt is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

Property Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 25 1 - 57
AD-2.8-AS 2.8 65 ▪ Contact cantilever for conductive AFM (C-AFM)/SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm 		Request for Quote
AD-2.8-SS 2.8 65 ▪ Contact cantilever for conductive AFM (C-AFM)/SSRM
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~5 nm 		Request for Quote
25Pt300B 18 20 Rocky Mountain Nanotechnology ▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm 		Request Quote

The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 300 ± 15%
Cantilever width /µm 110 ± 15%
Spring constant /(N/m) 18 ± 40%
Frequency /kHz 20 ± 30%
Tip radius /nm < 20  
NSC18/Cr-Au 2.8 75 Mikromasch ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm 		Request for Quote
Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
60 75 90 1.2 2.8 5.5 225 27.5 3.0
PPP-EFM 2.8 75 Nanosensors ▪ Probe for PFM/Conductive AFM/DC-EFM/SCM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm 		Request Quote

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
ElectriMulti75-G 3 75 BudgetSensors ▪ Probe for electrical modes (EFM/KPFM/PFM)/Conductive AFM
▪ Probe suitable for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm 		Request for Quote
PPP-NCSTPt 7.4 160 Nanosensors ▪ Probe suitable for Tapping mode and electrical measurements
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Tip shape: 4-sided
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: 25 nm 		Request for Quote
PtSi-CONT 0.2 13 Nanosensors ▪ Contact cantilever for conductive AFM (C-AFM)
▪ Platinum silicide coating on both sides of the cantilever
▪ Typical tip length: ~ 12.5 μm
▪ Typical tip radius: <25 nm 		Request for Quote
PtSi-NCH 42 330 Nanosensors ▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Backside reflex coating (PtSi)
▪ Conductive tip for electrical application, coated with PtSi
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: ~ 12.5 μm
▪ Typical tip radius: <25 nm 		Request for Quote
SD-R150-FM 2.8 75 Nanosensors ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~90 nm (from front) / 160 nm (from side) 		Request for Quote
SD-R150-NCL 48 190 Nanosensors ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~90 nm (from front) / 160 nm (from side) 		Request for Quote
SD-Sphere-FM-M 2.8 75 Nanosensors ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical sphere diameter: ~2 μm 		Request for Quote
SD-Sphere-NCH-M 42 320 Nanosensors ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical sphere diameter: ~2 μm 		Request for Quote
SSS-FMR 2.8 75 Nanosensors ▪ Cantilever with force constant suitable for FMM with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: 2 nm (< 5 nm) 		Request for Quote
Tap150Al-G 5 150 BudgetSensors ▪ Cantilever with force constant suitable for Tapping mode
▪ Backside reflective coating (Al)
▪ Tip shape: Rotated shape on ~15 μm setback position
▪ Typical tip length: ~17 μm
▪ Typical tip radius: ~10 nm 		Request for Quote
SD-R30-NCH 42 330 Nanosensors ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm 		Request for Quote
SD-R30-FM 2.8 75 Nanosensors ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm 		Request for Quote
SD-R30-CONT 0.2 13 Nanosensors ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm 		Request for Quote
NC-LC 100 450 ▪ Cantilever with high spring constant for nanomechanical measurement and Conductive AFM
▪ Backside reflex coating (Au)
▪ Tip shape: cone
▪ Single crystal diamond tip
▪ Typical tip length: ~175 nm
▪ Typical tip radius: ~20 nm 		Request for Quote
PPP-FMR 2 75 Nanosensors ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
PPP-FMAuD 2.8 75 Nanosensors ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ Typical tip length: ~12.5 μm
▪ Typical tip radius: ~7 nm 		Request for Quote
DT-FMR 6.2 105 Nanosensors ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 27.5 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 6.2 1.5 - 18.3
Resonance Frequency /kHz 105 65 - 155
PPP-NCSTR 7.4 160 Nanosensors ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 2.8 1.8 - 3.8
Mean Width /µm 27 19.5 - 34.5
Length /µm 150 140 - 160
Force Constant /(N/m) 7.4 1.2 - 29
Resonance Frequency /kHz 160 75 - 265
PPP-QFMR 2.8 75 Nanosensors ▪ Cantilever for Force Modulation Microscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: < 10 nm 		Request for Quote
NSC36/Al BS 1
2
0.6		 90
130
65		 Mikromasch ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: ▪ 3 cantilevers on a chip 		Request for Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
NSC14/HARD/AI BS 5 160 Mikromasch ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm 		Request for Quote
Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1
NSC19/Al BS 0.5 65 Mikromasch ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm 		Request for Quote
160AC-NA 26 300 Opus ▪ Tapping Mode cantilever with high resonant frequency
▪ Backside reflex coating (Al)
▪ Tip shape: Tetrahedral on zero setback position
▪ Typical tip length: 14 μm
▪ Typical tip radius: ~7 nm 		Request for Quote
NSC36/Al BS 1
2
0.6		 90
130
65		 Mikromasch ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm ▪ 3 cantilevers on a chip 		Request for Quote
.
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
MSS-Soft 13deg 2.8 75 Nanotools ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~250 nm
▪ Typical tip radius: <2 nm 		Request for Quote
Multi75Al-G 3 75 BudgetSensors ▪ Probe suitable for force modulation mode
▪ Backside reflective coating (Al)
▪ Tip shape: Rotated
▪ Typical tip length: ~17 μm
▪ Typical tip radius: <10 nm 		Request for Quote
PPP-CONTSCPt 0.2 25 Nanosensors ▪ Probe for PFM/C-AFM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm 		Request for Quote

The NANOSENSORS™ PPP-CONTSCPt is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

Property Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 25 1 - 57
NSC36/Cr-Au 0.6
1
2		 65
90
130		  Mikromasch ▪ Probe for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪3 cantilevers on a chip 		 Request for Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
NSC14/Cr-Au 5 160 Mikromasch ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm 		Request for Quote
Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1
PPP-NCSTAu 7.4 160 Nanosensors ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Au
▪ Typical tip length: 10 - 15 μm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 2.8 1.8 - 3.8
Mean Width /µm 27 19.5 - 34.5
Length /µm 150 140 - 160
Force Constant /(N/m) 7.4 1.2 - 29
Resonance Frequency /kHz 160 75 - 265
PtSi-FM 2.8 75 Nanosensors ▪ Probe for EFM/KPFM
▪ Platinum silicide coating on both sides of the cantilever
▪ Typical tip length: ~12.5 μm
▪ Typical tip radius: <25 nm 		Request for Quote
PPP-EFM 2.8 75 Nanosensors ▪ Probe for PFM/Conductive AFM/DC-EFM/SCM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm 		Request Quote

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
NSC36/Pt 1
2
0.6		 90
130
65		 MikroMasch ▪ Probe for PFM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ 3 cantilevers on a chip 		Request for Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
Cantilever A 30 90 160 0.1 1 4.6 110 32.5 1.0
Cantilever B 45 130 240 0.2 2 9 90 32.5 1.0
Cantilever C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
ElectriMulti75-G 3 75 BudgetSensors ▪ Probe for electrical modes (EFM/KPFM/PFM)/Conductive AFM
▪ Probe suitable for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm 		Request for Quote

Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

  value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 25 nm
Coating Conductive Cr/Pt on both sides
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
Contact Resistance 300 Ohms on platinum thin film surface
SPARK 70 Pt 2 70 ▪ Probe for EFM/KPFM/PFM/SCM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm 		Request for Quote
SPARK 150 Pt 18 150 ▪ PProbe for EFM/KPFM/PFM/SCM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm 		Request for Quote
SPARK 350 Pt 42 350 ▪ Probe for EFM/KPFM/PFM/SCM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm 		Request for Quote
PPP-NCHAu 42 330 Nanosensors ▪ Probe for EFM/KPFM
▪ Backside reflex coating (Cr-Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: <50 nm 		Request for Quote
PPP-NCHPt 42 330 Nanosensors ▪ Probe for EFM/KPFM
▪ Backside reflex coating (Cr/Pt-Ir5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: ~25 nm 		Request for Quote
Glass NanoPipette       ▪ Pipette for SICM
▪ Borosilicate glass pipette
▪ Pipette opening diameter: ~100 nm 		Request for Quote
SECCM Single Barrel Pipette       ▪ Pipette for SECCM Single Barrel
▪ Borosilicate glass pipette
▪ Pipette opening diameter: ~500 nm 		Request for Quote
Pt-Ir       ▪ 0.25 mm diameter Pt-Ir wire
▪ Tip shape: Sharpened tip end for STM 		Request for Quote
PPP-MFMR 2.8 75 Nanosensors ▪ Probe for MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip ▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <50 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
PPP-LC-MFMR 2.8 75 Nanosensors ▪ Probe for MFM (Low coercivity)
▪ Backside reflex coating (Al)
▪ Soft magnetic coating on the tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
PPP-LM-MFMR 2.8 75 Nanosensors ▪ Probe for MFM (Low magnetic momentum)
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip with reduced magnetic moment (0.5x) compared to PPP-MFMR
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <30 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
SSS-MFMR 2.8 75 Nanosensors ▪ Probe for high resolution MFM
▪ Backside reflex coating (Al)
▪ Hard magnetic coating on the tip with reduced magnetic moment (0.25x) compared to PPP-MFMR
▪ Typical tip radius: <15 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
NSC18/Co-Cr/Al BS 2.8 75 MikroMasch ▪ Probe for MFM
▪ Backside reflective coating (Al)
▪ Co-Cr coating on the tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <60 nm 		Request for Quote
Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
18 Series 60 75 90 1.2 2.8 5.5 225 27.5 3.0
NanoThermal-10 0.4   Kelvin ▪ Probe with resistive thermometer tip for SThM
▪ Tip made of NiCr and Pd
▪ Typical tip length: ~10 μm
▪ Typical tip radius: <100 nm
▪ Package of 10 (EA) 		Request for Quote
Probe base 2mm x 3mm
Cantilever (Silicon Nitride) 150μm x 60μm x 0.4um
Resistor metal 5nm NiCr + 40nm Pd
Track and pad metal 5nm NiCr + 140nm Au
Resistance 250-400Ω (Typ 320Ω)
Tip Radius <= 100nm
Tip height ~ 10 um
Tip Radius <= 100nm
Current max 2.2 ~ 2.4 mA dc
(recommended)
Spring constant 0.25 N/m (modelled)
Scanning Mode Contact
Sensitivity approx 1Ω / degC
Series resistors 2 x 100 Ω (± 25 Ω)
NanoThermal-5 0.25   Kelvin Nanotechnology ▪ Probe with resistive thermometer tip for SThM
▪ Tip made of NiCr and Pd
▪ Typical tip length: ~10 μm
▪ Typical tip radius: <100 nm
▪ Package of 5 (EA) 		Request for Quote
Probe base 2mm x 3mm
Cantilever (Silicon Nitride) 150μm x 60μm x 0.4um
Resistor metal 5nm NiCr + 40nm Pd
Track and pad metal 5nm NiCr + 140nm Au
Resistance 250-400Ω (Typ 320Ω)
Tip Radius <= 100nm
Tip height ~ 10 um
Tip Radius <= 100nm
Current max 2.2 ~ 2.4 mA dc
(recommended)
Spring constant 0.25 N/m (modelled)
Scanning Mode Contact
Sensitivity approx 1Ω / degC
Series resistors 2 x 100 Ω (± 25 Ω)
DT-NCHR 80 400 Nanosensors ▪ Probe suitable for lithography (scratch/Z scanner mode)
▪ Backside reflex coating (Al)
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm 		Request for Quote

NANOSENSORS™ DT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For applications that require hard contact between tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies is between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 80 23 - 225
Resonance Frequency /kHz 400 225 - 610
ElectriMulti75-G 3 75 BudgetSensors ▪ Probe for electrical modes (EFM/KPFM/PFM)/Conductive AFM
▪ Probe suitable for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm 		Request for Quote

Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

  value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 25 nm
Coating Conductive Cr/Pt on both sides
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
Contact Resistance 300 Ohms on platinum thin film surface
CDT-CONTR 0.5 20 Nanosensors ▪ Contact cantilever for conductive AFM
▪ Probe suitable for lithography (tip bias mode (oxidation mode))
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm 		Request for Quote
NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.5 0.1 - 1.7
Resonance Frequency /kHz 20 11 - 29
CDT-NCHR 80 400 Nanosensors ▪ Probe suitable for SSRM/lithography (tip bias mode (oxidation mode))
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 80 23 - 225
Resonance Frequency /kHz 400 225 - 610
25Pt300B 18 20 Rocky Mountain Nanotechnology ▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm 		Request Quote

The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 300 ± 15%
Cantilever width /µm 110 ± 15%
Spring constant /(N/m) 18 ± 40%
Frequency /kHz 20 ± 30%
Tip radius /nm < 20  
PPP-EFM 2.8 75 Nanosensors ▪ Probe for PFM/Conductive AFM/DC-EFM/SCM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm 		Request Quote

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
PPP-CONTSCPt 0.2 25 Nanosensors ▪ Probe for PFM/C-AFM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm 		Request for Quote

The NANOSENSORS™ PPP-CONTSCPt is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

Property Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 25 1 - 57
NSC36/Pt 1
2
0.6		 90
130
65		 MikroMasch ▪ Probe for PFM
▪ Probe for lithography (tip bias mode (oxidation mode))
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ 3 cantilevers on a chip 		Request for Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
Cantilever A 30 90 160 0.1 1 4.6 110 32.5 1.0
Cantilever B 45 130 240 0.2 2 9 90 32.5 1.0
Cantilever C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
NM-RC-SEM 350 750 ▪ Cantilever with high force constant for Nanoindentation
▪ Tip shape: cone
▪ Single crystal diamond tip
▪ Typical tip length: ~500 nm
▪ Typical tip radius: ~10 nm
 Request for Quote
BL-AC40TS 0.09 110 (25 in water) Olympus ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Effective tip length: ~3.5 μm (total 7 μm)
▪ Typical tip radius: ~8 nm 		Request for Quote
Cantilever
Resonance Frequency [kHz] 110
(75 - 145)
25 in water
(17 - 45)
Spring Constant [N/m] 0.09
(0.02 - 0.14)
Shape Rectangular
Length × Width × Thickness [µm] 38×16×0.2
Probe
Shape Tetrahedral
Length [µm] 7
Effective probe length [µm] 3.5
Tip radius [nm] 8
PNP-DB 0.48
0.06		 67
17		 Nanoworld ▪ Contact cantilever made of Silicon Nitride
▪ Backside reflex coating (Au)
▪ 2 cantilevers on a chip 		Request for Quote

The Pyrex-Nitride probes have silicon nitride cantilevers witd very low force constants and integrated oxide sharpened, pyramidal tips witd a height of 3.5 µm. The tip is located 4 µm behind tde free end of tde cantilever. This probe series features a support chip tdat is made of Pyrex. Two chip versions are available: The DB series witd rectangular / diving board cantilevers and tde TR series having triangular cantilevers. Botd sides of tde chip have identical cantilevers.

Cantilever Data Cant. 1 Cant. 2
Shape Diving Board
Resonance Frequency 67 kHz 17 kHz
Force Constant 0.48 N/m 0.06 N/m
Lengtd 100 µm 200 µm
Mean Widtd 40 µm 40 µm
Thickness 0.5 µm 0.5 µm
PNP-TR 0.32
0.08		 67
17		 Nanoworld ▪ Contact cantilever made of silicon nitride
▪ Backside reflective coating (Au)
▪ Tip shape: Pyramidal
▪ 2 triangular cantilevers on a chip 		Request for Quote
Cantilever Data Cant. 1 Cant. 2
Thickness 0.5 µm 0.5 µm
Mean Width 13.5 µm 28 µm
Length 100 µm 200 µm
Force Constant 0.32 N/m 0.08 N/m
Resonance Frequency 67 kHz 17 kHz
DNP-S 0.35 
0.12 
0.24
0.06		 65
23
56
18		 Bruker ▪ Probe for imaging soft samples
▪ Backside reflective coating (Au)
▪ Typical tip length: 2.5 - 8 μm
▪ Typical tip radius: ~10 nm (<40 nm) ▪ 4 triangular cantilevers on a chip 		Request for Quote

Premium Contact Mode or Fluid TappingMode imaging and force measurement probes, sharpened for higher-resolution. Unmounted for BioScope / Dimension AFMs.

Shape Resonant Freq.kHz Spring Const.N/m Lengtdµm Widtdµm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
A Triangular 65 50 80 0.35 0.175 0.7 120 125 115 25 20 30
B Triangular 23 16 28 0.12 0.06 0.24 205 200 210 40 25 45
C Triangular 56 40 75 0.24 0.12 0.48 120 115 125 20 15 25
D Triangular 18 12 24 0.06 0.03 0.12 205 200 210 25 20 30
NSC36/Cr-Au 0.6
1
2		 65
90
130		  Mikromasch ▪ Probe for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪3 cantilevers on a chip 		 Request for Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
qp-BioAC 0.06
0.1
0.3		 30
50
90		  Nanosensors ▪ Non-Contact cantilever with high resonant frequency
▪ Backside reflective coating (Al)
▪ Typical tip length: 7 μm
▪ Typical tip radius: < 10 nm
▪ 3 triangular cantilevers on a chip 		 Request for Quote

 
USC-F0.3-k0.3 0.3 300 Nanoworld ▪ Probe suitable for bio application
▪ Backside reflective coating (Au)
▪ Cantilever dimension: 20 μm length / 10 μm width
▪ Typical tip length: 2.5 μm
▪ Typical tip radius: < 10 nm
▪ Tip shape: Cone shaped (EBD type) 		 Request for Quote
R-NCLR 8M for 3DM 48 190 Nanosensors ▪ Mounted R-NCLR cantilever for 3DM ATX
▪ Backside reflex coating
▪ Compatible with 3DM ATX
▪ Cassette of 8 (EA) 		Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
NCHR 8M for 3DM 42 330 Nanosensors ▪ Mounted PPP-NCHR cantilever for 3DM ATX
▪ Backside reflex coating
▪ Compatible with 3DM ATX
▪ Cassette of 8 (EA) 		Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
NCHR 12M for ATX 42 330 Nanosensors ▪ Mounted PPP-NCHR cantilever for industrial systems with ATX
▪ Backside reflex coating
▪ Compatible with standard ATX
▪ Cassette of 12 (EA) 		Request for Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
DT-CONTR 2.8 75 Nanosensors ▪ Contact cantilever for AFP
▪ Backside reflex coating
▪ Diamond-coated tip 		Request for Quote
Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.5 0.1 - 1.7
Resonance Frequency /kHz 20 11 - 29
ACLA-TL 58 190 AppNano ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al) 		Request for Quote
ACSTA-TL 7.8 150 AppNano ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al) 		Request for Quote
ACTA-TL 37 300 AppNano ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al) 		Request for Quote
ACTA-TL 0.8
0.3
0.4		 40
20
30		 mikromasch ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ cantilevers on a chip 		Request for Quote
NSC35/tipless/Al BS 8.9
16
5.4		 205
300
150		 mikromasch ▪ Tipless cantilever for special applications
▪ Backside reflex coating (Al)
▪ 3 cantilevers on a chip 		Request for Quote
TL-CONT 0.2 13 Nanosensors ▪ Tipless cantilever for special applications Request for Quote
MSNL 0.07
0.02
0.01
0.03
0.1
0.6		 22
15
7
15
38
125		 Bruker ▪ Cantilever for Tapping Mode in liquid
▪ Backside reflex coating (Au)
▪ Typical tip length: 2.5 - 8.0 μm
▪ Typical tip radius: 2 nm
▪ 6 cantilevers on a chip 		Request for Quote
PPP-CONT 0.2 13 Nanosensors ▪ Cantilever for Contact Mode in liquid
▪ Typical tip length: 10-15 μm
▪ Typical tip radius: <10 nm 		Request for Quote
PPP-CONT 40 300 BudgetSensors ▪ Cantilever for Tapping Mode in liquid
▪ Tip shape: Rotated shape on ~15 μm setback position
▪ Hard diamond-like-carbon coated tip
▪ Typical tip length: 17 μm
▪ Typical tip radius: <15 nm 		Request for Quote
USC-F0.3-k0.3 0.3 300 Nanoworld ▪ Probe suitable for bio application
▪ Backside reflective coating (Au)
▪ Cantilever dimension: 20 μm length / 10 μm width
▪ Typical tip length: 2.5 μm
▪ Typical tip radius: < 10 nm
▪ Tip shape: Cone shaped (EBD type) 		Request for Quote
OMCL-AC55TS 85 1600 Olympus ▪ Non-contact cantilever with high resonant frequency
▪ Backside reflective coating (Au)
▪ Tip shape: Tetrahedral
▪ Typical tip length: ~12 μm
▪ Typical tip radius: ~7 nm 		Request for Quote
PPP-CONTSC 0.2 25 Nanosensors ▪ Contact cantilever
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm 		Request for Quote

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