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blended polymers Nanofiber Plug Tungsten Dr.JurekSadowski Electrical&Electronics Chemical_Vapor_Deposition Ceramics FuelCell StrontiuTitanate TempControl Vanadate NUSNNI semifluorinated_alkanes Patterns STM block_copolymer oxide_layer WWafer Corrosion NUS_NNI_Nanocore Inorganic Cross-section MagneticArray PVAP3HT Organic exfoliate Laser self_assembly SrO Fe_film SoftSample MagneticForceMicroscopy Beads Polyaniline
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V