-
F14H20 Chemical Vapor Deposition ForceDistanceSpectroscopy ThermalDetectors Chrome DeflectionOptics DomainSwitching Vac Aluminum TriGlycineSulphate Magnets Electrode Mosfet SiliconCrystal CntFilm ShenYang Lateral_Force_Microscopy light_emission HDD Praseodymium GaP epitaxy CuParticle TCS SRAM Self-assembledMonolayer Defects AM_SKPM SSRM silicon_carbide CuFoil membrane UnivOfMaryland Phase AtomicLayer
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defect of LinbO₃
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.3 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 1024×512
- Cantilever : SCOUT 350 (k=42N/m, f=350kHz)