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CuFoil CrystalGrowing FAFailureAnlaysis Pore ScratchMode aluminum_nitride MfmAmplitude Workfunction STM AM-KPFM layers LeakageCurrent Metal-organicComplex EFM MembraneFilter SrTiO3 CuSubstrate SmallScan Crystal Polyethylene DataStorage Adhesion Cobalt-dopedIronOxide PhaseChange Trench PS_PVAC LateralPFM PolymerPatterns ContactMode chemical_compound PatternedSapphireSubstrat Wafer ThermalProperties molecule Tin sulfide
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Adhesive system
Scanning Conditions
- System: NX10
- Scan Mode: PinPoint
- Cantilever: ACST (k=7N/m, f=150kHz)
- Scan Size: 30μm×30μm, 20μm×20μm
- Scan Rate: 0.23Hz
- Pixel: 256×256
- Scan Mode: PinPoint
- Cantilever: ACST (k=7N/m, f=150kHz)
- Scan Size: 30μm×30μm, 20μm×20μm
- Scan Rate: 0.23Hz
- Pixel: 256×256