-
Magnetic Force Microscopy Growing HighAcpectRatio Mfm MechanicalProperty fifber suspended_graphene NeodymiumMagnets pinpoint mode Oxide Chromium Patterns OxideLayer Optoelectonics Yeditepe_University fluorocarbon China contact PetruPoni Piezoelectric UTEM domain_switching HighResolution semifluorinated alkane HumanHair Defects FM_KPFM Optoelectronic Pyroelectric ThinFilm Litho SiliconeOxide Regensburg Imprint phase_change
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
PDMS liquid crystal
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×512