Application of Atomic Force Microscopy in perovskite solar cells (Chinese/中文)

As one of the most powerful scanning probe microscopy (SPM) techniques, atomic force microscopy (AFM) can not only detect the morphology of the films, but also characterize the phase composition and surface potential of the films. At the same time, perovskite solar cells have been attracting intense interests, in which the morphology and quality of the perovskite film sensitively affects device performance. As a result, AFM is widely used in perovskite solar cells to reveal the relationship between device performance and nanoscale morphology of films. The webinar will facus on two aspects: 1) What functions of AFM can be used to characterize perovskite solar cells? 2) How to use AFM to reveal the underlying mechanism of perovskite solar cells? More specifically, the webinar will be divided into two parts: 1) Application of atomic force microscopy in organic-inorganic hybrid perovskite solar cells with amino-functionalized TiO2 as electron transport layers; 2) Application of atomic force microscopy in bulk heterojunction bismuth-based lead-free perovskite solar cells.

Speaker：
Dr. Wanpei Hu

Wanpei Hu is currently a Ph.D. candidate in Prof. Shangfeng Yang in University of Science and Technology of China. Her research interests focus on the interface modification in perovskite solar cells and novel lead-free perovskite solar cells. She has published over 10 research papers, 5 of them are as first author, including Advanced Materials, Nano Energy, Advanced Functional Materials, ACS Applied Materials and Interfaces, Solar RRL, Trends in Chemistry et al.