Advances in Atomic Force Microscopy: Nanomechanical Characterization by using PinPoint™ AFM
Advances in Atomic Force Microscopy:
Nanomechanical Characterization by using PinPoint™ AFM
AFM Workshop
When:
- 21-22 March, 2019 / Iasi, Romania
Where:
- “Alexandru Ioan Cuza” University, Iasi, Faculty of Physics-Department of Plasma Advanced Research Center (IPARC), 1st floor, Building A
NX10 AFM
Program
Thursday, March 21
- 10:00 Welcome
- 10:15 Introduction
- 10:30 Talk: “Advances in Atomic Force Microscopy: Nanomechanical Characterization by using PinPoint™ AFM”/ Victor Bergmann, Application Scientist, Park Systems Europe
- 11:15 Introduction to NX10 AFM /Live Demonstration on site (design and technical advantages, AFM scanners, How to change the tip on Park AFMs, etc.) / Claudia Moldovan, Schaefer Romania
- 11:30 - 13:00 Live Measurements
- 13:00 Lunch
- 14:15 - 16:00 Live Measurements
Thursday, March 21
- 10:00 - 13:00 Live Measurements
The End
Contact: Justyna Sliwa, Park Systems | Claudia Moldovan, Schaefer SouthEast