In partnership with the University of Münster, Park Systems is proud to announce a free workshop and live demo to take place on June 22, 2017 at the Center for Nanotechnology (CeNTech), University of Münster, Germany.

The workshop will provide a detailed introduction to the new key attributes of a modern AFM technology, such as True Non-Contact™ Mode and Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. During the subsequent instrument demonstration, you will have the opportunity to learn the innovative functionality of the Park NX10 System—a tool designed to enable the accurate and reproducible measurements in advanced research. The entire event is open to all interested parties and includes lunch.

• Evnet Start: 10am
• Location: Center for Nanotechnology (CeNTech), University of Muenster
• Directions: www.centech.de/index8.htm
• Program:
  - Morning talk: "SPM core & ancillary technology for advanced research"
  - Afternoon live demo: Park NX10 AFM