• Park Announces PinPoint Conductive AFM

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PinPoint Conductive AFM was developed for well defined electrical contact between the tip and the sample. The XY scanner stops as the electrical current is acquired with contact time controlled by the user. PinPoint Conductive AFM allows higher spatial resolution, without lateral force, with optimized current measurement over different sample surface. The comparison of conductive AFM images of ZnO nanorods show that while conventional contact conductive AFM may have a higher current measurement than tapping conductive AFM, its resolution is compromised as the tip wears out in contact mode topography. The new PinPoint conductive AFM shows the best of both higher spatial resolution and optimized current measurement. READ MORE