ニュース
SANTA CLARA, CALIF. MARCH 02, 2018
Park Systems, world leader in Atomic Force Microscopy (AFM) will showcase their world-leading Atomic Force Microscopesat the 147th Ann...
Mannheim, Germany, Feb 13, 2018
Park Systems, world-leading manufacturer of Atomic Force Microscopes celebrated the grand opening of their European Headquarters on Febru...
Dr. Bahgat G. Sammakia, Interim President of Polytechnic Institute, the world’s most advanced, university-driven research enterprise and home of Park Systems new NanoScie...
Using scanning capacitance microscopy with a Park Systems atomic force microscope a team at NASA successfully characterized both the spatial variations in capacitance as ...
Park NX Wafer Low Noise, High Throughput Automatic Force Profiler with Automatic Defect Review
Park continues to produce cost saving value proposition innovations ...
Park NX Wafer Low Noise, High Throughput Automatic Force Profiler with Automatic Defect Review
Park continues to produce cost saving value proposition innovations for se...
SANTA CLARA, Calif., June 5, 2017
Park Systems, world-leading manufacturer of Atomic Force Microscopes (AFM), just announced new Park NX12, an affordable versatile platf...
SANTA CLARA, Calif., April 18, 2017
Park Systems, world-leader in atomic force microscopy (AFM) recently announced the opening of their European Headquarters in Heidelbe...
14
Feb 2017'
Press-Release
SANTA CLARA, CA (Marketwired - February 13, 2017)
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997, just announced that Park SmartScan a...
15
Nov 2016'
Press-Release
SANTA CLARA, CA NOVEMBER 10, 2016
Park Systems announces the 2017 Park AFM Scholarship Award eligible to undergraduate or postdoctoral students working in nanotechnology...