Workshops
At Park Systems we offer live demos to better show the capabilities and functions of our equipment. Found below is a list of the upcoming demos we are hosting along with links to register for each event.
For further information, click on ‘Details’ for the demo you are interested in.
At Park Systems we offer live demos to better show the capabilities and functions of our equipment. Found below is a list of the upcoming demos we are hosting along with links to register for each event.
For further information, click on ‘Details’ for the demo you are interested in.
Join us for free beer and a live demo to learn about some of the new breakthroughs at Park Systems
Automatic Defect Review (ADR):
High throughput ADR for 300 mm blank wafers with Park atomic force microscopy (AFM)
| Event Date | 02-24-2015 |
| Event End Date | 02-24-2015 |
| Cut off date | 11-30-2024 |
| Individual Price | Free |
Park SmartScan: The revolutionary way to image with AFM with a click of a button
| Event Date | 12-09-2014 |
| Event End Date | 12-09-2014 |
| Cut off date | 11-30-2024 |
| Individual Price | Free |
Surface Roughness Measurement with AFM: Using non-contact mode imaging for angstrom level roughness measurement
| Event Date | 09-25-2014 |
| Event End Date | 09-25-2014 |
| Cut off date | 11-30-2024 |
| Individual Price | Free |
High Quality Liquid AFM Imaging: Size and Elasticity Measurements in Nanoparticle Samples
| Event Date | 08-22-2014 |
| Event End Date | 08-22-2014 |
| Cut off date | 11-30-2024 |
| Individual Price | Free |