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DataStorage Growth Semiconductor TPU PolymerBlend SelfAssembly Fendb Hole INSPParis WWafer Hafnia Metal ConductiveAFM self-assembled_monolayer PvdfBead Non-ContactMode CrossSection Genetic GaP Flake MetalCompound Workfunction Composite doped multi_layer ElectroChemical LithiumNiobate aluminum_nitride HanyangUniv Oxidation Silicon Typhimurium BoronNitride Force-distance Ito
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MoS2
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36C Cr-Au(k=0.6N/m, f=65kHz)
- Scan Size: 12μm×12μm
- Scan Rate: 0.15Hz
- Pixel:256×256
- Scan Mode: KPFM
- Cantilever: NSC36C Cr-Au(k=0.6N/m, f=65kHz)
- Scan Size: 12μm×12μm
- Scan Rate: 0.15Hz
- Pixel:256×256