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FFM Polyvinylidene_fluoride Semiconductor AtomicLayer MetalCompound Mechanical&nanotechnology PolymerPatterns Butterfly Holes ContactMode Display Croatia light_emission ring shape MBE temperature controller AFM Lateral_Force_Microscopy Glass SoftSample Hafnium_dioxide Chemical Vapor Deposition Piezo ScratchMode SAM CarbonNanotube FrequencyModulation PUR Resistance Hydroxyapatite Defect Polyethylene Nanotechnology Melt hard_disk_media TransitionMetal
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Graphene_hBN Moiré Pattern
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 500nm×500nm,
- Scan Rate: 2Hz, 4Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 500nm×500nm,
- Scan Rate: 2Hz, 4Hz
- Pixel: 256 × 256