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ContactModeDots HafniumDioxide Non-ContactMode DLaTGS ScanningTunnelingMicroscopy silicon_oxide Wafer ScanningSpreadingResistanceMicroscopy BCZT hetero_structure TemperatureControl STM dielectric trench SKKU PolyvinylideneFluoride PolycrystallineFerroelectricBCZT Pores Granada Litho NUS_NNI_Nanocore C36H74 LiquidCell plastic Potential UTEM atomic_steps Bmp Glass Adhesive Austenite YttriaStabilizedZirconia GalliumPhosphide kelvin probe force microscopy pinpoint mode Adhesion
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ContactModeDots HafniumDioxide Non-ContactMode DLaTGS ScanningTunnelingMicroscopy silicon_oxide Wafer ScanningSpreadingResistanceMicroscopy BCZT hetero_structure TemperatureControl STM dielectric trench SKKU PolyvinylideneFluoride PolycrystallineFerroelectricBCZT Pores Granada Litho NUS_NNI_Nanocore C36H74 LiquidCell plastic Potential UTEM atomic_steps Bmp Glass Adhesive Austenite YttriaStabilizedZirconia GalliumPhosphide kelvin probe force microscopy pinpoint mode Adhesion