-
medical TyphimuriumBiofilm MultiLayerCeramicCapacitor Nanostructure WPlug SRAM chemical_compound molecular_beam BismuthFerrite SiliconCrystal Phthalocyanine plastics Adhesion TemperatureControllerAFM Varistor Sapphire Graphene H-BN Mosfet MagneticPhase MultiferroicMaterials InorganicCompound Ram Conductive AFM ScanningIon-ConductanceMicroscopy Leakage OrganicCompound atomic_layer amplitude_modulation Typhimurium Butterfly self_assembly Ito 2-vinylpyridine Optoelectonics
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Trench Etch Profile on MESA
Top dielectric trench etch profile on MESA on Si wafer.
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 6μm×6μm
- Scan Rate: 0.12Hz
- Pixel Size: 1024 × 256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 6μm×6μm
- Scan Rate: 0.12Hz
- Pixel Size: 1024 × 256