-
SRAM ForceVolume Leakage MagneticPhase HighResolution Styrene ForceDistanceSpectroscopy ThermalDetectors ito_film Glass GlassTemperature FuelCell CastIron Resistance SoftSample AM_SKPM temp_control LateralForce PolyStylene InsulatorFilm Imprint Steps MultiferroicMaterials thermoplastic_elastomers tip_bias_mode FailureAnalysis 2-vinylpyridine Yttria_stabilized_Zirconia Hexatriacontane SThM doped SiliconeOxide Defect Topography LightEmission
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, W-plug
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V