-
frequency_modulation IIT-chennai Cobalt Force-distance Layer HiVacuum BoronNitride ItoGlass Scanning_Thermal_Microscopy Celebration KAIST Spain Pinpoint PFM PvdfBead CHRYSALIS_INC Magnetic Force Microscopy Oxidation IRDetector Holes Chemical Vapor Deposition FrequencyModulation ContactMode TemperatureControllerStage ScanningIon-ConductanceMicroscopy EvatecAG TriGlycineSulphate Array Sapphire Nanotechnology BiasMode Phthalocyanine SiWafer CuSubstrate Solution Strontium
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512