-
FailureAnalysis CuSubstrate aluminum_nitride Lanthanum_aluminate TemperatureControlledAFM MonoLayer Zhi Holes SThM Styrene pinpoint mode Friction PvdfBead Ucl MechanicalProperties AIN INSP LogAmplifier bias_mode Worcester_Polytechnic_Institute BTO OpticalWaveguide Mosfet contact Imprint multi_layer TyphimuriumBiofilm PANI Mechinical graphene_hybrid Cobalt PinpointNanomechanicalMode Dopped PolymerBlend optoelectronics
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512