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ThermalProperties Switching EFM temperature controller AFM Hexacontane Potential TCS Forevision SetpointMode Sphere SoftSample Boron Molybdenum_disulfide non_contact Glass Ceramics suspended_graphene LiftMode HfO2 SiWafer NusEce oxide_layer Force-distance AdhesionForce NanoLithography MfmAmplitude Regensburg atomic_layer TiO2 ConductiveAFM UTEM Wafer MolybdenumDisulfide Wildtype HighAspect
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Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512