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Change IMT_Bucharest BoronNitride SSRM Vacuum Resistance Patterns Polystyrene Mechanical&nanotechnology Bacterium Genetic DIWafer SiliconOxide Vac TPU Adhesion PolymerPatterns SRAM LateralForce ContactModeDot Phthalocyanine LaAlO3 LightEmission molecular_self_assembly Switching InorganicCompound INSPParis InsulatorFilm HighResolution TemperatureControllerStage Formamidinium_lead_iodide Pinpoint DomainSwitching Semiconductor Carbon
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Copper Foil
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.5Hz
- Pixel: 512512