-
Reduction ChemicalCompound InsulatorFilm CBD MembraneFilter SelfAssembly TCS Inorganic doped GaAs Melt NanoLithography Ito PinPointMode Boundary Wonseok FailureAnalysis Zagreb mono_layer SoftSample molecular_self_assembly PinpointPFM H-BN Defect Ca10(PO4)6(OH)2 IIT-chennai ForceVolume semifluorinated_alkane ForceDistanceSpectroscopy ScanningKelvinProbeMicroscopy alkanes Pattern Fet thermal_property VortexCore
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
HfO2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: ElectriMulti75 (k=3 N/m, f=75kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 256×256