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Chrome optoelectronics Mapping medical PhaseImaging AAO PolymerBlend FrequencyModulation MeltingPoint Au111 NUS_Physics doped SrTiO3 GranadaUniv silicon_carbide MolybdenumDisulfide flakes SicMosfet Copper C36H74 Dopped temp SKKU Protein DeoxyribonucleicAcid LifeScience IRDetector Defects ThinFilm HfO2 dielectric trench Laser ScratchMode MetalCompound LMF
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HfO2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: ElectriMulti75 (k=3 N/m, f=75kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 256×256