-
FailureAnlaysis CeramicCapacitor Conductivity OpticalModulator ContactModeDots LeakageCurrent ScanningKelvinProbeMicroscopy NtuEee ChemicalCompound PtfeFilter LiftMode Sio2 Electronics Polyethylene Ferrite ito_film LiBattery PS_LDPE Leakage Magnetic Force Microscopy Varistor Alloy Copper SicMosfet Water Blend Materials molecular_self_assembly Piezoelectric CuSubstrate 2dMaterials mono_layer Thermal ItoGlass Fendb
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Co/Cr/Pt
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm