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Polymer FailureAnalysis mfm_amplitude molecular_self_assembly AM-KPFM ElectroDeposition India F14H20 EPFL Jason Floppy NCM\ fluoroalkane light_emitting 3-hexylthiophene Cross-section Composition Chungnam_National_University MetalCompound Ananth SoftSample GaN Piezo SKPM self-assembly Nickel Yeditepe_University PatternedSapphireSubstrat Hole solar_cell OpticalWaveguides mechanical_property OxideLayer Microchannel nanobar
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MoS2
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36C Cr-Au(k=0.6N/m, f=65kHz)
- Scan Size: 12μm×12μm
- Scan Rate: 0.15Hz
- Pixel:256×256
- Scan Mode: KPFM
- Cantilever: NSC36C Cr-Au(k=0.6N/m, f=65kHz)
- Scan Size: 12μm×12μm
- Scan Rate: 0.15Hz
- Pixel:256×256