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Ferroelectric Magnetic Force Microscopy PVAC TyphimuriumBiofilm AtomicSteps Defect pinpoint mode Mapping Moire BaTiO3 Polarization Mosfet ElectroDeposition pulsed_laser_deposition Zagreb Phase Ceramic SiliconCrystal conductive PhaseTransition Electical&Electronics Biofilm Conductivity phase_change rubber Techcomp TipBiasMode Aggregated_molecules AIN PFM LateralForceMicroscopy ScanningKelvinProbeMicroscopy epitaxy SKPM DiffractiveOpticalElements
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PS/LPDE
Spincast layer of PS/LDPE blend on Si. Signal change by thermal conductivity difference.
Scanning Conditions
- System: NX10
- Scan Mode: SThM
- Cantilever: NanoThermal Probe
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel Size: 256 × 512
- Scan Mode: SThM
- Cantilever: NanoThermal Probe
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel Size: 256 × 512