-
Zagreb Techcomp Chungnam_National_University Sapphire Mechanical atomic_layer FAFailureAnlaysis semifluorinated_alkane MolybdenumDisulfide Solar PFM Korea graphene_hybrid F14H20 LogAmplifier Ceramics block_copolymer Granada fluoroaalkane PS_LDPE VinylAlcohol Nickel Barium_titanate BCZT self_assembly PinpointNanomechanicalMode BiasMode plastic conductive IVSpectroscopy Materials molecule BoronNitride IndiumTinOxide PvdfFilm
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Ferroelectric 2L-hBN
Scanning Conditions
- System : FX40
- Sample bias: 0.25 V, 0.8 V
- Scan Mode: C-AFM
- Scan Rate : 8 Hz
- Scan Size : 1.5μm×1.5μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)