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DIWafer Composition temperature_control MoirePattern IndiumTinOxide Alkane layers ContactModeDot hetero_structure Varistor TemperatureControllerAFM TransitionMetal ForceVolumeImage AEAPDES CuParticle ScratchMode light_emission AM_KPFM ImideMonomer IISCBangalore ScanningThermalMicroscopy Gallium_Arsenide Forevision thermal_conductivity SiliconOxide Metal Temperature phase_change PUR fluoroalkane NanoLithography Pzt Gold AdhesionForce Typhimurium
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Polyaniline (PANI)
Scanning Conditions
- System: XE7
- Scan Mode: Non-contact
- Cantilever: ACTA (k=40N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 512×512