-
ContactMode LiftHeight Composition Sic Pores Array MultiferroicMaterials NUSNNI PpLdpe NanoLithography Alloy Hafnium_dioxide piezoelectric force microscopy AnodizedAluminumOxide LiBattery OpticalWaveguide fluoroalkane Fluoride Mechanical&nanotechnology Gong Topography MagneticArray Subhajjit dielectric trench lithography Conduct Copper alkanes Regensburg AM-KPFM C60H122 Thermoplastic_polyurethane StyreneBeads HBN Mapping
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
MoS2
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36C Cr-Au(k=0.6N/m, f=65kHz)
- Scan Size: 12μm×12μm
- Scan Rate: 0.15Hz
- Pixel:256×256
- Scan Mode: KPFM
- Cantilever: NSC36C Cr-Au(k=0.6N/m, f=65kHz)
- Scan Size: 12μm×12μm
- Scan Rate: 0.15Hz
- Pixel:256×256