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Domain SrTiO3 Bismuth Flake ForceMapping ForceVolumeMapping molecules WWafer CntFilm Gong Indent SPMLabs SmalScan BiFeO3 kelvin probe force microscopy 2d_materials Chromium Phase Resistance hard_disk_media Hysteresys Deposition NanoLithography Optoelectonics plastic ScanningThermalMicroscopy Etch ScanningIon-ConductanceMicroscopy Techcomp Copper Yttria_stabilized_Zirconia Al2O3 Magnetostrictive Chrome Austenite
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PMN-PT single crystal
Scanning Conditions
- System: NX10
- Scan Mode: PFM
- Cantilever: NSC36A Ti-Pt (k=1N/m, f=90kHz)
- Scan Size: 8μm×8μm
- Scan Rate: 0.5Hz
- Pixel: 512×256