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SoftSample flakes Ananth hydrocarbon lithography AtomicLayer CompactDisk VinylAlcohol Multiferroic_materials NiFe LightEmission ContactModeDots HighAcpectRatio conductive Ram Fujian hard_disk YszSubstrate nanobar Graphite HfO2 FuelCell light_emission semifluorinated_alkanes PinPointMode IMT_Bucharest SmalScan SingleCrystal Temperature ULCA BaTiO3 self_assembly BismuthFerrite SKKU Polyethylene
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WLI image of wafer ID mark
Scanning Conditions
- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm