-
NCM Growing FM_KPFM pulsed_laser_deposition Pores Led Defects margarine Singapore thermal_property AnodizedAluminumOxide Domain mono_layer IcelandSpar Silicon C60H122 Aluminum MonoLayer Sio2 YttriaStabilizedZirconia SiliconeOxide SiliconOxide Korea Optoelectonics Kevlar LiquidCrystal Vac LFM SThM Memory University_of_Regensburg StrontiuTitanate Bmp ShenYang fifber
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512