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Hysteresys Modulus non_contact FastScan Ram Current Aluminum optoelectronics Strontium Blend ito_film KevlarFiber Array Neodymium AEAPDES WWafer gallium_nitride membrane Aluminium_Oxide HighAspect Hydroxyapatite CrAu BariumTitanate Roughness TungstenThinFilmDeposition ScanningIon-ConductanceMicroscopy ShenYang Dopped graphene_hybrid molecule Sidewall FrictionalForce Magnetic AM_KPFM Polyvinylidene_fluoride
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Ferroelectric 2L-hBN
Scanning Conditions
- System : FX40
- Sample bias: 0.25 V, 0.8 V
- Scan Mode: C-AFM
- Scan Rate : 8 Hz
- Scan Size : 1.5μm×1.5μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)