-
TungstenThinFilmDeposition Fet high_resolution SPMLabs Polarization hetero_structure Scanning_Thermal_Microscopy Kevlar Sadowski Imprint DLaTGS IVSpectroscopy Organic Mfm TemperatureControlledAFM Tungsten_disulfide Terrace StyreneBeads ito_film Vinylpyridine Boundary Bismuth Phase Praseodymium Filter Techcomp Liquid HiVacuum CaMnO3 UnivOfMaryland HOPG VerticalPFM ForceVolumeMapping Pinpoint Polymer
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BiVO4 on treated YSZ substrate
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.36Hz
- Pixel: 256×256