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LiftHeight Varistor Phase Al2O3 UTEM Inorganic SICM HighResolution Au111 Electrical&Electronics Monisha Morphology LateralForce Celebration Growing CalciumHydroxide Lateral_Force_Microscopy ForceVolumeImage BreastCancerCell phase_change DataStorage China Silicon Hair 2d_materials TappingMode TCS dielectric trench MolecularSelfAssembly 2dMaterials CeramicCapacitor ThermalDetectors Bio LaAlO3 layers
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CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V