-
Bismuth Polystyrene GaP Deposition Vortex LiIonBattery AtomicSteps blended polymers Vanadate #EC Device SKKU NtuEee Pattern Kevlar 2d_materials Etch Strontium Scanning_Thermal_Microscopy SmalScan 3-hexylthiophene Blend NUS_NNI_Nanocore H-BN PetruPoni_Institute food SoftSample PatternedSapphireSubstrat PinPointMode SThM semifluorinated_alkane Phthalocyanine Spincast Hexacontane Nanofiber
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V