In partnership with the University of Maryland, Park Systems is proud to announce a free workshop and live demo to take place on May 24, 2016 at the University of Maryland. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

In partnership with the Center for Nanoscale Systems, Park Systems is proud to announce a free workshop and live demo to take place on May 19, 2016 at Harvard University. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

In partnership with the Molecular Foundry, Park Systems is proud to announce a free workshop and live demo to take place on November 9, 2015 at Molecular Foundry. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM module—hardware designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

In partnership with the Stanford Nano Shared Facilities (SNSF), Park Systems is proud to announce a free workshop and live demo to take place on November 10, 2015 at Stanford University. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM module—hardware designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

Park Systems returns to SEMICON West in 2015 to exhibit our acclaimed atomic force microscopy solutions tailored for industry research and production applications.

While you visit us on the show floor at the Moscone Center, come by the ThirstyBear Brewing Company on July 15 as we host an Atomic Force Microscopy (AFM) Luncheon focusing on our latest innovation, the Park NX-Hivac, a brand-new high vacuum Scanning Spreading Resistance Microscopy (SSRM) and AFM system for optimal results in semiconductor manufacturing failure analysis!

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