Beyond Imaging

Workshop on Atomic Force Microscopy

17 October, 2017
Centre for Innovation Competence ZIK SiLi-nano®, Halle /Germany

We are very excited to welcome you on 17 October in Halle and share with you our AFM experience and challenges!

Event location and host:
Fraunhofer CSP
Otto-Eißfeldt-Str. 12
06120 Halle (Saale)
Seminarraum (1st floor)
Start: 10.00 am

In proud partnership with the Universidad Nacional de Colombia, Park Systems is proud to announce a free atomic force microscopy (AFM) workshop, live demo, and sample evaluation to take place from August 16 to 18, 2017 at the Universidad Nacional de Colombia's campus in Medellin, Colombia.

The workshop will provide a detailed introduction to the new key attributes of modern AFM technology, such as True Non-Contact™ Mode and Self-Optimizing Scan Control as well as PinPoint Mode that are great for various topography and mechanical imaging in both air and liquid environment, all from Park Systems. During the subsequent instrument demonstration you will have the opportunity to learn the innovative functionality of the Park NX10 AFM System—a tool designed to enable the accurate and reproducible measurements in advanced research—and have the opportunity to evaluate your samples. This entire event is open to all interested parties and includes lunch.

Discovering Advanced AFM

International Workshop on Atomic Force Microscopy

12 October, 2017 at Centro Congressi Area della Ricerca CNR, Bologna, Italy 

Registration closes on Monday, October 9, 23.59

Organized together with the facility SPM@ISMN of ISMN Bologna and supported the Italian Society for Microscopical Science (SISM).

Local organizing committee: Dr. Cristiano Albonetti, Dr. Marco Brucale, Dr. Eva Bysternova, Dr. Denis Gentili and Dr. Francesco Valle

Location:
Centro congressi Area della Ricerca CNR di Bologna
Via P. Gobetti, 101 40129 Bologna – Italy

Begin: 13:00

In proud partnership with the Seitz Materials Research Laboratory, Park Systems is proud to announce a free workshop and live demo to take place on August 3, 2017 at the University of Illinois at Urbana-Champaign. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 AFM System w/ SICM Module—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

Park Systems returns to SEMICON West in 2017 to exhibit our acclaimed atomic force microscopy solutions tailored for industry research and production applications.

While you visit us on the show floor at the Moscone Center, come by the ThirstyBear Brewing Company on Tuesday, July 11 as we host an Atomic Force Microscopy (AFM) Luncheon featuring talks from special guest speakers: Dr. Sang-il Park, Chairman & CEO of Park Systems and Prof. Krishna Saraswat, Rickey/Nielsen Professor in the School of Engineering at Stanford University.