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PetruPoni_Institute TemperatureControl Copolymer Fujian GaN Electrical&Electronics Bismuth NtuEee China HDD Polyvinylidene SetpointMode OpticalModulator piezoelectric force microscopy mfm_amplitude IVSpectroscopy LightEmiting Solution SKKU Trench Mapping Battery silicon_oxide exfoliate Perovskite ElectroDeposition ElectrostaticForceMicroscopy pulsed_laser_deposition AM-KPFM ForceVolume LiquidCell Gong Worcester_Polytechnic_Institute NUS_Physics Ucl
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SnS2 Flakes
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256