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single_layer SolarCell Indium_tin_oxide SrTiO3 Step CrAu NCM HardDiskMedia PolymerPatterns Forevision piezoelectric force microscopy Vac ForceVolumeMapping Scanning_Thermal_Microscopy nanomechanical self_healing Morphology Aggregated_molecules Polyvinylidene_fluoride Yeditepe_University AtomicLayer PtfeMembrane BaTiO3 frequency_modulation TemperatureControlledAFM SSRM Polytetrafluoroethylene cooling Mobile HfO2 Optoelectronic ElectroDeposition C60H122 Magnets OpticalModulator
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Defect of LinbO₃
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.3 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 1024×512
- Cantilever : SCOUT 350 (k=42N/m, f=350kHz)