-
Hexacontane SmalScan ScanningTunnelingMicroscopy GaP Chloroform Ito molecules Spain Praseodymium 2-vinylpyridine Barium_titanate BFO BiVO4 Vortex Spincast KevlarFiber membrane Biofilm thermoplastic_elastomers Terrace Temasek_Lab SetpointMode BloodCell Co/Cr/Pt IndiumTinOxide ScanningSpreadingResistanceMicroscopy HACrystal Current Flake Layer HardDiskMedia PDMS ferromagnetic Aggregated_molecules AdhesionEnergy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, Failure analysis
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 11μm×11μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Sample bias: -0.5V