-
Austenite Pipette Tin disulfide Cobalt-dopedIronOxide Ecoli silicon_oxide SiliconeOxide Chemical Vapor Deposition atomic_steps Aggregated_molecules Deposition ThermalProperties Jason BiFeO3 SmallScan ScanningTunnelingMicroscopy ContactModeDot PUR UnivMaryland ConductiveAFM flakes Varistor HACrystal Bacterium LightEmission Film multi_layer temperature controller AFM BCZT gallium_nitride Hexylthiophene Pinpoint NCM Mechinical SrTiO3
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BiVO4 on treated YSZ substrate
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.36Hz
- Pixel: 256×256