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lithography InorganicCompound PFM epitaxy ConductiveAFM CNT MechanicalProperty Aluminium_Oxide Neodymium Glass CntFilm Optic StainlessSteel Polyurethane Step SPMLabs cross section Current Inorganic_Compound ScanningThermalMicroscopy LightEmission pulsed_laser_deposition Chemical Vapor Deposition SelfAssembly NUSNNI Jason flakes IVSpectroscopy ForceVolume Electrode Boundary 2dMaterials AIN optoelectronics LFM
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Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256