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ForceDistanceSpectroscopy Dr.JurekSadowski LDPE PinpointNanomechanicalMode MfmAmplitude Tape Carbon solar_cell NCM\ ScanningSpreadingResistanceMicroscopy ForceVolumeImage FAFailureAnlaysis MagneticForce SicMosfet self_assembly Dental KPFM Aluminum SiliconeOxide ItoGlass Heating TappingMode Polytetrafluoroethylene HardDiskMedia PatternedSapphireSubstrat Bacterium Wafer GlassTemp fluoroaalkane FrictionalForceMicroscopy cooling Led Ferrite Layer NUS
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NiFe
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm