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SetpointMode Current LaAlO3 TemperatureControllerStage Electrode Epoxy InsulatorFilm FAPbI3 Wafer Morphology PvdfFilm DLaTGS Reduction Typhimurium Defect UTEM Nanotechnology mfm_amplitude non_contact FastScan Tin sulfide Sulfur epitaxy Multiferroic_materials HighResolution LFM BismuthVanadate temp HexagonalBN PrCurve Mfm ThinFilm TappingMode Austenite SmalScan
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Calcium Hydroxyapatite Crystal growing
HA crystal grows according to the annealing time. From 24hrs, the crystal becomes clearly.
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.17Hz
- Pixel: 512×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.17Hz
- Pixel: 512×256