News
5
Oct 2011'
Press-Release
Elexience, the leading distributor of electronic and physical characterization solutions in France, has signed a distribution agreement with Park Systems, the leadin...
1
Sep 2011'
Press-Release
Suwon, South Korea, Sep. 01, 2011
Park Systems, the leading nanotechnology solutions partner of nanoscale measurements, launched multi language websites&n...
Welcome to Park Systems’ Q3, 2011 Newsletter
In this Issue: Featured Application&nb...
27
Jun 2011'
Press-Release
"Three-Dimensional Imaging of Undercut and Sidewall Structures by Atomic Force Microscopy," authored by researchers at Park Systems and published in Review of Scientific ...
Welcome to Park Systems’ Q2, 2011 Newsletter
In this Issue: Featured Application Featured Product News a...
11
Apr 2011'
Press-Release
April 11, 2011
Park Systems has decided to provide free maintenance service to its Atomic Force Microscope (AFM) users in Japan, whose Park AFM systems were damaged...
28
Mar 2011'
Press-Release
March 28, 2011
As part of the continuing expansion of its Japanese operation, Park Systems Corp. has appointed Dr. Mineharu Suzuki as General Manager of Park Systems Jap...
14
Feb 2011'
Press-Release
Suwon, South Korea, Feb. 14, 2011
The XE-150 atomic force microscope from Park Systems was featured in a recent Nature article, entitled “Hard-tip, Soft-...
Welcome to Park Systems’ Q1, 2011 Newsletter
In this Issue: Featured Appli...
21
Jan 2011'
Press-Release
Park Systems, the AFM technology leader and preferred nanotechnology research and industrial solutions partner, recently released an informative video, entitled “How AFM ...