This focused workshop series will provide an opportunity to Design, Process, Metrology, Yield and Failure Analysis Engineers to interface directly with Park Systems’ advanced applications experts and discuss day-to-day nanoscale solutions that address device manufacturing challenges.

Nanoscale Solutions for Design and Manufacturing of Electronic Devices – a digital workshop series

Register for the first workshop , held on June 25th

WHY PARK SYSTEMS ATOMIC FORCE MICROSCOPES

• • Leader in Automated AFM Equipment
• • Industry's sole non-destructive inspection and metrology technology, bundled in a single instrument
• • Lower in-fab costs compared to individual inspection or metrology tools
• • Fully-automated fleet matching tools enable day-to-day solutions for manufacturing yield challenges
• • The choice of many of the top 20 Semiconductor Manufacturers

WHY PARK SYSTEMS ATOMIC FORCE MICROSCOPES

• • Device Scaling and Novel Structure Designs
• • Process Advancements to Enable High Volume Manufacturing Solutions
• • Inspection and Metrology Methods to Capture Yield Excursion
• • Packaging and Reliability Considerations.

Park Systems, Schaefer Romania and Ruđer Bošković Institute are pleased to invite you to a workshop on Advances and Accuracy in Atomic Force Microscopy: Nanocharacterization for Materials Science, which will take place in October, 2020 at Ruđer Bošković Institute.

We will demonstrate advances in nanocharacterization techniques on the Park NX10 AFM during a live demo session.

Date: October, Week 12-16

Place: Ruđer Bošković Institute, Zagreb, Croatia

This workshop is open to everyone and is free of charge.

This is a 1-day Workshop. The exact date will be specified at the beginning of September 2020.

The 34th edition of The Surface & Interface Days (JSI 2020) will take place on 22 to 24 January 2020 at the Pierre and Marie Curie campus of Sorbonne University, France.

Park Systems France is honored to contribute to the event with a booth and practical hands-on-sessions on Park NX20 large sample AFM!

Get hands on the newest generation of Atomic Force Microscopy (AFM) and sign up for a hands-on-session slot on Park Systems NX20 large sample AFM. Learn about the latest updates in materials’ nanocharacterization with wide range of nanomechanical, magnetic and electrical measuring modes, such as Scanning Spreading Resistance Microscopy SSRM, conductive AFM (C-AFM) and Scanning Capacitance Microscopy (SCM).

Biological Sample Preparation for Ultra-Structure Analysis

We are pleased to invite you to the “Biological Sample Preparation for Ultra-Structure Analysis” scheduled on 28 - 29 November 2019 at University of the Philippines – Los Banos (UPLB-BIOTECH). In this workshop, participants will be given the opportunity to learn about the latest studies being formed using AFM.

Date

• 28 - 29 November 2019

Time

• 13:00 - 17:00

Place

• University of the Philippines - Los Banos

Detect the Defect! Advantages of Automated Atomic Force Microscopy [AFM] for Semiconductor Applications

SEMICON EUROPA 2019, Munich, Germany

Date: Tuesday, November 12 – Friday, November 15, 2019

Time: 12:00 pm

Place: Neue Messe München, Munich, Germany

Enjoy the lunch snacks and the seminar on: “Detect the defect! - on Advantages of Automated Atomic Force Microscopy [AFM] for Semiconductor Applications,” presented by Dr. Christian Froeck.

In the 30-minutes presentation we will be revealing the latest insights into AFM industrial applications such as Automatic Defect Review, 3D surface information, surface roughness, trench depth, via or bump analysis, High Vacuum AFM for Electrical Measurements and Failure Analysis, and more!

The LUNCHEON is open to everyone and is FREE of charge.