-
Adhesion vertical_PFM sputter ThermalConductivity ForceVolumeImage tip_bias_mode Pattern Array Temasek_Lab NTU TipBiasMode Memory Hafnium_dioxide CalciumHydroxide Bismuth NUS_Physics Polymer FFM HDD Hair Indent Conductance Singapore Organic Oxidation ContactModeDots Composite EFM PrCurve lithography Mechinical contact IRDetector Adhesive C60H122
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BN thin film on Si
Scanning Conditions
- System: NX10
- Scan Mode:SThM
- Cantilever: Nanothermal probe
- Scan Size: 25μm×25μm, 5μm×5μm
- Scan Rate:0.3Hz, 0.5Hz
- Pixel: 256×256, 256×256
- Scan Mode:SThM
- Cantilever: Nanothermal probe
- Scan Size: 25μm×25μm, 5μm×5μm
- Scan Rate:0.3Hz, 0.5Hz
- Pixel: 256×256, 256×256