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Patterns tip_bias_mode AAO Pore Vac Piezoresponse KAIST Nanotechnology ferromagnetic C36H74 CeNSE_IISc mfm_amplitude CeramicCapacitor Mosfet LDPE Scanning_Thermal_Microscopy HafniumDioxide PvdfFilm Sio2 AEAPDES Switching FrictionalForce thermal_conductivity STO LateralForce MagneticForce Fe_film fluoroalkane FM-KPFM FFM PVAC Gong ScratchMode Permalloy Alkane
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Graphene on SiO2
Scanning Conditions
- System: NX20
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256