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CrossSection InsulatorFilm Lateral_Force_Microscopy HiVacuum Flake TemperatureControl PvdfBead ForceVolume EPFL 3-hexylthiophene Granada hydrocarbon Metal mono_layer VerticalPFM #EC HACrystal C36H74 Magnets Pinpoint KevlarFiber WS2 Lanthanum_aluminate Aggregated_molecules Chromium IRDetector Cobalt Water FailureAnalysis Aluminium_Oxide Grain PtfeFilter Calcite PANI Au111
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Polycrystalline ferroelectric BCZT
Scanning Conditions
- System: NX12
- Scan Mode: PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.4Hz
- Pixel: 256×256
- Sample bias sweep range for Piezoresponse curve: -10V ~ +10V