-
Ucl IMT_Bucharest TPU sputter Inorganic_Compound Change LDPE Hafnia ThermalProperties piezoelectric force microscopy InsulatorFilm FM-KPFM KAIST SKKU block_copolymer Patterns LFM Hafnium_dioxide PetruPoni Bacteria ShenYang Ni81Fe19 Yeditepe_University Electronics TemperatureControllerAFM Non-ContactMode LateralForce Litho Lateral_Force_Microscopy SiliconCrystal Vacuum fe_nd_b Pattern NUS NtuEee
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Polycrystalline ferroelectric BCZT
Scanning Conditions
- System: NX12
- Scan Mode: PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.4Hz
- Pixel: 256×256
- Sample bias sweep range for Piezoresponse curve: -10V ~ +10V