-
HardDisk Ceramics LowDensityPolyethylene ThermalConductivity Current 3-hexylthiophene TiO2 dichalcogenide ElectroDeposition CrAu Growth NiFe nanomechanical SmallScan StyreneBeads CompactDisk DOE Tungsten AnodizedAluminumOxide CancerCell ThermalProperties DLaTGS Mosfet ReflexLens ContactMode ForceVolume Yttria_stabilized_Zirconia CaMnO3 flakes BaTiO3 SoftSample Materials DataStorage Layer BoronNitride
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
WLI image of wafer ID mark
Scanning Conditions
- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm