-
EvatecAG semifluorinated_alkanes CrossSection Gallium_Arsenide Electical&Electronics TCS OpticalWaveguide SICM ThermalConductivity HardDisk VortexCore PVAC Molybdenum oxide_layer Copper MechanicalProperties TransitionMetal Indium_tin_oxide BismuthFerrite light_emitting Ferrite LightEmission ContactModeDots DLaTGS Scanning_Thermal_Microscopy exfoliate non_contact Silver Worcester_Polytechnic_Institute LMF TappingMode ImideMonomer Polyvinylidene HexacontaneFilm Pores
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512