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PatternedSapphireSubstrat Optical layers frequency_modulation Ferroelectric pulsed_laser_deposition align ElectrostaticForceMicroscopy FailureAnalysis Sio2 INSP bias_mode Cross-section Sidewall Ananth Sic PhaseImaging YttriaStabilizedZirconia Hafnium_dioxide #EC Ito HfO2 silicon_oxide Conduct PhthalocyaninePraseodymium TiO2 Temasek_Lab Litho Styrene Tungsten_disulfide piezoelectric force microscopy Film Morphology ElectroDeposition MLCC
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Polymers
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 1Hz
- Pixel: 512×512