-
Sadowski Indent Ca10(PO4)6(OH)2 TungstenDeposition 3-hexylthiophene Subhajjit TCS PECurve PrCurve PinpointPFM Phenanthrene Magnets PDMS Fet Mosfet MembraneFilter SicMosfet VerticalPFM Ceramic SSRM phase_change MultiferroicMaterials ConductingPolymer Iron Conductance INSPParis Nanotechnology Copolymer Device LiquidImaging TemperatureControlledAFM STO DeoxyribonucleicAcid Ucl GaN
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CrAu surface
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256