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Fluoride AM_SKPM chemical_compound Growing Mfm MagneticForceMicroscopy Celebration MultiLayerCeramicCapacitor PinPointMode temperature_control ring shape ScanningThermalMicroscopy TappingMode ULCA BiVO4 SolarCell FrictionalForce Anneal SetpointMode SingleLayer Ito CntFilm Self-assembledMonolayer Piezo DOE Hexacontane NUS_NNI_Nanocore Scanning_Thermal_Microscopy AIN STM Polarization Non-ContactMode Gong SurfaceChange LogAmplifier
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CrAu surface
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256